Early Access Program IntelliJ IDEA

IntelliJ IDEA 2023.1 Beta Is Out!

IntelliJ IDEA 2023.1 Beta is now available! You can download the latest build from our website, via the free Toolbox App, or by using snaps for Ubuntu.

The Beta version provides all of the new features and improvements expected in the upcoming major release. This series of IntelliJ IDEA 2023.1 EAP blog posts covers the most notable updates. Here are some of the highlights:

  • Multiple enhancements for the new UI.
  • Full IDE zoom.
  • New editor settings.
  • VCS status color hints in the Structure tool window.
  • Improved code review workflow for GitHub.
  • Improvements for working with Markdown files.
  • Scanning files to index in smart mode.
  • Custom regexp-based search and replace inspections.
  • Improvements for Gradle.
  • Faster Maven project import.
  • New Java inspections.
  • Improved IntelliJ IDEA profiler.
  • Navigation for Spring Security Matchers.
  • Spring Security 6.0 support.
  • Editing improvements for OpenAPI Specifications.
  • Ability to run MongoDB queries in the Database console from Spring and Micronaut Data repositories.
  • Kubernetes and Docker updates.

IntelliJ IDEA 2023.1 Beta also includes an additional update that is covered below. Take a look!


Improved Extract Method refactoring

We’ve upgraded the Extract Method refactoring by introducing the option to apply it even when the selected code fragment features several variables that need to be returned. In these cases, the IDE first suggests wrapping these variables into a new record or bean class and then performing method extraction.

You can find the complete list of changes introduced within the ongoing development cycle in the release notes.

The team is now working on polishing the new functionality, and you can help us by sharing your feedback! Try out the recently added features and let us know about your experience on Twitter or in the comments section below. If you find a bug, please report it to our issue tracker.

Happy developing!

image description

Discover more